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KLA Investor Conference Presentation Deck

SiC at KLA Proven Solutions soitec Soitec boosts customer yield of Silicon Carbide semiconductor manufacturing with KLA inspection technology Soitec boosts customer yield of Silicon Carbide semiconductor manufacturing with KLA inspection technology Bernin (Grenoble), France, July 13th, 2022 Soitec (Euronext Paris), an industry leader in designing and manufacturing innovative semiconductor materials, has selected KLA Corporation (NASDAQ: KLAC), a leader in process control and advanced inspection systems, to enable high yield manufacturing of innovative Silicon Carbide (SIC) devices for the automotive industry. Soitec leverages its unique and patented SmartSiCTM technology to produce SiC substrates, which aim to improve the performance of power electronics devices and boost electric vehicles' energy efficiency. Based on its track record of using KLA's inspectors for its Silicon-on-Insulator (SOI) wafers, Soitec has extended its partnership with KLA and selected the Surfscan" SP AZ unpatterned inspection system for its SmartSICTM wafers. Soitec's SmartSicTM wafers provide superior and unique crystal quality, while KLA's Surfscan SP A2 leverages DUV optics and advanced algorithms to support substrate quality control. This partnership will enable SIC substrate production at new and even more sophisticated levels, supporting the industry to bring high quality SiC semiconductors in high volumes to the automotive market. 17 KLA Non-Confidential | Unrestricted Highlights from KLA's SiC Portfolio Process SPTS го THE plasma etch Inspection Wy Metrology SETS MACH plasma dicing Lar ULA PECVD **** S SPTS III. inspection solutions for substrate/epitaxy, patterned wafer and inline defect screening DE Escape PVD At Risk wh Overkill metrology solutions for wafer shape, films, overlay, CD, implant and analytics KLA+
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