Financial Overview and Growth Strategy

PDF has a Unique View & Comprehensive Access to Data Across the Supply Chain Coverage by PDF/SOLUTIONS Wafer-level grading and disposition ✓ Test reduction and adaptation Design Semis manufacturing Parametric test Wafer sort Assembly Final System-level test test ✓ Die quality and RMA prediction ✓ Virtual metrology ✓ Yield prediction ✓ Predictive maintenance Simulation data Materials data Process data Metrology data E-test data Wafer test data Traceability data FDC data Reliability Performance data data PDF/SOLUTIONS™ © 2022 PDF Solutions, All Rights Reserved ✓ Fault detection and classification ✓ Capacity and efficiency improvement Connectivity to equipment for control and data exchange 6

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