Intel Investor Meeting 2014

Increasing Yield Increasing Matching 22 fa May June Yield at the same point in development IN 22nm 14nm 14nm Status - 2014 July Aug Yield is now in healthy range with further improvements coming Sept Jan Mar Key Parameter Matching % of key process parameters meeting 3-sigma targets at the same point in development Apr 22nm 14nm Weeks 14 nm key process parameter matching on track with 22 nm trend May Jun Source: Intel Module Switching Energy Change (%) 225% 175% 125% 75% 25% 14 -25% -75% Transistor Interconnect Thermo- Performance Improvement Switching Energy vs. Gate Delay -30% -10% Mechanical/Moisture Test Vehicle Yield ESD/LU Alpha Particle/Soft Error 30% 10% Delay Change (%) Reliability Scorecard at the same point in development 22nm (2 year offset) 14nm 50% 14nm PRQ achieved Q2 2014 22nm 14nm 70% Low risk Meeting all cert goals Medium risk Close to meeting goals High risk Not yet meeting all goals, needs additional work

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