KLA Investor Conference Presentation Deck

Differentiated Product Portfolio Process Process Control Wafer-Level Packaging SPTS Delta ™M PECVD CIRCLTM-AP wafer SPTS Omega Plasma Etch all-surface inspection 22 KLA Non-Confidential | Unrestricted SPTS Mosaic ™M Plasma Dicing KronosTM 1190 wafer inspection SPTS Sigma PVD Zeta-580 wafer 3D metrology Final Assembly and Test ICOS™TM F160XP wafer/tape inspection, die sort THE RE ICOS TM T3, T7, T8, MV9 tray-tray & tray-tape Inspection, metrology Die Sort Component Sort KLA+

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