Intel Investor Meeting 2014

Increasing Yield Increasing Matching 22 здата May June. Yield at the same point in development July 22nm 14nm OCT 14nm Status - 2013 Jan Aug Sept Yield rapidly increasing, on track for matched yield in Q1 '14* Feo Key Parameter Matching % of key process parameters meeting 3-sigma targets at the same point in development 22nm 14nm Weeks 14 nm key process parameter matching on track with 22 nm trend Module Switching Energy Change (%) 225% Source: Intel. * Forecast 175% 125% 75% 25% 14 -25% -75% Transistor Interconnect Thermo- Performance Improvement Switching Energy vs. Gate Delay -30% Mechanical/Moisture Test Vehicle Yield ESD/LU Alpha Particle/Soft Error -10% 30% 10% Delay Change (%) Reliability Scorecard at the same point in development 22nm (2 year offset) 50% 14nm 22nm 14nm 70% Low risk Meeting all cert goals Medium risk Close to meeting goals High risk Not yet meeting all goals, needs additional work Generally healthy reliability at this stage, on track for Q1 '14 certification *

View entire presentation