Aeva Results Presentation Deck slide image

Aeva Results Presentation Deck

4D LIDAR Chip Update 3rd Generation LIDAR Chip Module Completed • One quarter ahead of schedule Enables final cost structure and form factor Completed Initial Reliability Testing Temperature step ● ● Improved reliability by eliminating all fiber optics Already being produced at production intent factory ● Random vibration Thermal shock AEVA 4D LIDAR s AEVA 15
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