KLA Investor Day Presentation Deck
Complementing Industry Screening Methods to Improve Reliability
▪ Current screening methodology is a statistical
technique that was introduced by Automotive
Electronics Council (AEC) in 1997 and based on an
Electrical Test (EWS¹)
New Automotive Process Control Methodology
"Zero-Defect" Pyramid
I 2016: 5M vehicle recall after defects found within
corroding airbag semiconductors, resulting in a
cost of $10B to manufacturers
▪ 2019: KLA defines new screening methodology to
minimize failures in automotive semiconductor
technology
Pass
Reliability Risk
Fail
87 KLA Non-Confidential | Unrestricted 1 EWS Electrical Wafer Sorting.
Die Screening
Prevent potential
reliability failures from
escaping the fab
AI
I-PAT
Screening
Analytics
(what matters)
Recipe Quality
(sensitivity)
Strategy and Methods
(sampling, layers, BKMs)
Capability and Capacity
(tools, tool health)
Process
Control
Optimize fab
quality reducing
overall defectivity
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